SEM - Taramalı Elektron Mikroskobu

Scanning Electron Microscope (SEM) is a type of electron microscope that produces images of a sample surface by scanning samples with a focused beam of electrons. The JEOL JSM-5410 SEM in our lab is capable of imaging sample surface morphologies by using secondary electrons or back-scattered electrons, equipped with an Energy Dispersive X-ray Spectrometer (EDS) for chemical analysis. With robust W filament, the SEM is capable of characterizing different materials.

• Resolution: 3.5 nm (Accv. 30 kV, WD = 6 mm, secondary electron image)

• Magnification: x15 (WD = 48 mm) to 200,000 (25 steps)

• Image modes:

– Secondary electron image (SEI) HV Mode

– Backscattered electron image (BEI) HV Mode

– Backscattered electron image (BEI) LV Mode

• Accelerating voltage: 0.5 to 30 kV

• EDAX Genesis Software: Point, line, and area EDS analysis as well EDS mapping