XRD-X-Ray Diffractometer

Equipment XRD-X-Ray Diffractometer Brand Philips Specifications X-ray tube (Co, but others at request): line focus and point focus Goniometer (0 – 160 °2θ, min step size 0.005 °2θ) Fixed divergence and anti-scatter slits (1/32, 1/16, 1/8, 1

Category
Characterization Laboratory

Data table for XRD-X-Ray Diffractometer – ITU Surface Lab

Equipment

XRD-X-Ray Diffractometer

Brand

Philips
Specifications
  • X-ray tube (Co, but others at request): line focus and point focus
  • Goniometer (0 – 160 °2θ, min step size 0.005 °2θ)
  • Fixed divergence and anti-scatter slits (1/32, 1/16, 1/8, 1/4 , 1/2, 1, 2, 4° )
  • Fixed receiving slits (0.1, 0.2, 0.3 mm)
  • Incident beam filter (tube dependent, no diffracted beam monochromator)
  • Incident beam mask (2, 5, 10, 15, 20 mm)
  • Gas filled proportional detector
  • Point focus
  • Goniometer (0 – 150 °2θ, min step size 0.005 °2θ)
  • Eulerian cradle (0 <ψ< 90 degrees, 0 <φ< 360 degrees)
  • Parallel plate collimator (0.27 rad)
  • Ø 2mm quasi parallel incident beam opening.
  • Gas filled proportional detector
Internal links
Guide

How to Interpret XRD

Use phase and crystallographic information to support coating interpretation.

Guide

What Is Profilometry?

Move from height maps to roughness interpretation and surface process decisions.

Guide

What Is XPS?

See how surface-sensitive chemistry helps interpret oxide layers and interfaces.

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