Optic Profilometer is part of the Characterization Laboratory infrastructure at ITU Surface Lab. This page summarizes where the device sits in the laboratory workflow, what kind of measurements or process steps it supports, and why it matters in applied surface engineering studies.
In practice, the device is used to compare coating behavior, process stability, microstructural response, or surface-related performance outputs under controlled research conditions. The goal is not only to list the equipment, but to clarify the role it plays in experiment design and interpretation.
The summary, metadata cards, and detailed content below connect the device to real laboratory questions such as deposition strategy, corrosion response, tribological performance, characterization depth, or data reliability across projects and publications.
Equipment Optic Profilometer Brand Veeco WYKO NT1100 The Wyko® NT1100 provides accurate, non- contact surface metrology for applications in MEMS, thick films, optics, ceramics, advanced materials and many more. Specifications Measurement Te
| Equipment | Optic Profilometer |
|---|---|
| Brand | Veeco WYKO NT1100 |
The Wyko® NT1100 provides accurate, non- contact surface metrology for applications in MEMS, thick films, optics, ceramics, advanced materials and many more.
| Specifications | |
|---|---|
| Measurement Techniques | optical phase-shifting and white light vertical scanning interferometry |
| Measurement Capability | three-dimensional, non-contact, surface profile measurements |
| Objectives | 1.5X, 2.5X, 5.0X, 10X, 20X, 50X; long working distance objectives available; optional manual turret |
| Field-of-View Lenses | 0.5X, 0.75X, 1.0X, 1.5X, 2.0X |
| Measurement Array | user-selectable, maximum array 736 x 480 |
| Light Source | tungsten halogen lamp (user-replaceable); manual filter selection |
| Stages | manual; ± 50.8mm (± 2in.) X/Y translation, ± 4° tip/tilt; optional automated stitching stage, ± 50.8mm (2in.) X/Y |
| Optical Assembly | integrated illuminator; interchangeable discrete field-of- view lenses; closed – loop precision vertical scanning assembly |
| Video Display | 127mm (5in.) monochrome monitor |
| Computer System | PC with latest Celeron® processor, 430mm (17in.) SVGA monitor; optional printers and network cards |
| Software | Wyko Vision® software running under Microsoft® Windows XP® |
Related Guides
What Is Profilometry?
Move from height maps to roughness interpretation and surface process decisions.
How to Measure Surface Roughness
Relate roughness metrics to wetting, adhesion, friction, and functional response.
What Is Surface Energy?
Read wetting and adhesion through the lens of surface energy and contact angle.
Coating Thickness Measurement Methods
Compare the practical routes used to read film thickness and section geometry.
Surface Characterization Methods
Use the broader interpretation map that connects imaging, chemistry, and topography.
How to Interpret SEM-EDS
Tie morphology and composition together to read coatings and degradation behavior.
How to Interpret XRD
Use phase and crystallographic information to support coating interpretation.
How Film Thickness Affects Performance
Read thickness as a performance variable rather than only a geometric value.
